Patent No.: 12,147,284
Date of Patent: November 19, 2024
Characterizing fault injection on power distribution networks with voltage sensors
Power and electromagnetic fault injection vulnerabilities in an integrated circuit (IC) can be characterized sampling one or more integrated timing sensors in real-time or by equivalent-time sampling.
To achieve equivalent-time sampling, a series of fault injection attempts are performed. An array of timing sensors implemented in part of the IC capture a measure of relative propagation delay, which fluctuates proportionally with instantaneous voltage.
Increased voltage fluctuation can indicate elevated probability of faults in digital logic. Related apparatus, systems, techniques and articles are also described.