A collaboration between MITRE, University of Maryland’s Quantum Technology Center and Harvard has received the best paper award at the International Symposium for Testing and Failure Analysis (ISTFA) Workshop held virtually on December 7–9, 2020. The paper, titled “Backside Integrated Circuit Magnetic Field Imaging with a Quantum Diamond Microscope,” describes a new type of sensing technology to measure the magnetic signature of integrated circuits.
The MITRE team includes Edlyn Levine, Rachel Bainbridge, Dmitro Martynowych, Sean Oliver, and Dan Walters. This work can provide important advances in ensuring the security of integrated circuits. The paper is a follow-up to an earlier paper to extend the use of the quantum diamond microscope technique.